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Manual XYZ Linear Loader with Magnetic Knob Probe Table - XYZ Axis Platform Size 40 x 40 mm Accuracy 1 Micron with Magnetic Base (Left)

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$499.90

$ 99 .00 $99.00

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1.Size:Kla-4040v-left

2.Style:Left

3.Qty.:

About this item

【Triple Axis Precision Adjustment】With separate X/Y/Z axis control function with a travel range of up to 13 mm, making it ideal for semiconductor waffle alignment and microelectronic testing
【Heavy Duty Aluminum Frame】This construction is constructed using a CNC processing process and is equipped with a corrosion resistant coating to ensure a long-term stability even during high frequencies
【1 Micron Ultra High Accuracy】The precision silk and ball guide design ensures reproducible accuracy up to (±1 micron) for reliable test results
【Two installation options available】Compatible with magnetic base (300 nf suction power) and vacuum base (0.08 MPa vacuum pressure), suitable for non-ferrous metal surfaces
【Wide Application】Widely used in optical instruments, measuring equipment, test clamps, semiconductor manufacturing equipment, tester, microscope, transport vehicles, processing machinery.

Product Description

Product Highlights

Ultra-Precision Adjustment：Differential head offers 0.25mm precision per turn, with controllable accuracy up to 1μm, ensuring meticulous operation.
Premium Structure Design：Combines precision guide rail with adjustable function, eliminating backlash and rear seat force (pre-adjusted to recommended status before delivery).
Stable Base Configuration：Comes with self-developed magnetic base or vacuum suction base, providing strong adsorption force to keep the probe stable during use.
Universal Compatibility：Features standard mounting holes, perfectly adapting to various standard collets.

Adjustable Axes	X+Y+Z axis
Adjustment Stroke	X 0.51in/Y 0.51in/Z 0.51in
Adjustment Method	Precision Screw
Guide Rail Structure	Bead Roller Guide Rail
Screw Precision	0.0098in/turn
Usage Accuracy	1μm
Working Surface Size	1.58in×1.58in
Mounting Hole Distance	Vertical: 0.32in–0.32in–0.32in
Overall Dimensions	3.940in×2.61in×3.39in
Net Weight	2.25lb
Mounting Hole Distance	Horizontal:0.98in

Show the front panoramic view of a precision adjustment instrument. The main body is black, equipped with red adjustment knobs and a metal base at the bottom, clearly presenting the overall appearance structure.

Second image：Present two same-type adjustment instruments placed side by side. The red parts of the instruments are marked with the "Y" logo, displaying the style and logo details when the devices are side by side.

Present the side view of the instrument. The adjustment component of one instrument is unfolded, showing the operation structure and component linkage status on the side of the instrument.

The image depicts a set of sophisticated experimental equipment. At the center is a binocular microscope, beneath which is a base with a rotating platform, surrounded by multiple manipulator arms and connecting wires. The manipulator arms on the left and right sides are combinations of probe stations and fixtures, utilized for scientific research or experimental analysis at the microscopic level, such as semiconductor testing and optical experiments.

AAG-02

Product Features：

● The AAG - 02 series Angle Probe Gripper has a stable structure, is lightweight and agile, and is applicable to most probe station configurations.

Packaging Include

1x probe holder
1xfixture

Magnetic RF probe positioners

The using precision is 1 micrometer.

Probe holders are widely used. In semiconductors, they test circuits like wafers. In optoelectronics, for LED performance. In materials science, for superconductor properties. In microelectronics & nanotech, for precise measurement. In biomedicine, for biomaterial compatibility. In research & education, for experiments & talent. Also in energy, aerospace, etc.

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